Design and Performance Test of Anti-high-overload Protective Structure

REN Xiao-jun, YOU Wen-bin, ZHOU You-liang, NIU Yue-ting

Packaging Engineering ›› 2017 ›› Issue (11) : 64-68.

Packaging Engineering ›› 2017 ›› Issue (11) : 64-68.

Design and Performance Test of Anti-high-overload Protective Structure

  • REN Xiao-jun1, YOU Wen-bin1, ZHOU You-liang1, NIU Yue-ting2
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Abstract

The work aims to design a new type of double-layer buffer-isolation circuit protective structure and conduct performance test, with respect to the problem that the valid data fails because the recorder is damaged by the high impact and high overload acceleration due to hard landing in the recovery process of missile-borne recorder. The deformation and overload characteristics of the structure in the impact process were simulated and analyzed in combination with Ansys/Workbench finite element numerical simulation software, and the Marshall hammer was adopted to simulate the high impact and high overload environment experiments on the recorder with the protective structure. The recorder stored the signals of acceleration sensors embedded inside and outside the double-layer protection enclosure. Then, the data from multiple tests were processed and analyzed. When the overload acceleration was less than 25 000g, the multilayer protective structure had good cushioning effect and could properly protect the recorder; and the acoustic impedance difference of each layer of materials would affect the overall protection effect. The greater the difference was, the better the effect was. The protective structure can effectively reduce the impact effect to protect the electronic equipment in the high overload impact environment.

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REN Xiao-jun, YOU Wen-bin, ZHOU You-liang, NIU Yue-ting. Design and Performance Test of Anti-high-overload Protective Structure[J]. Packaging Engineering. 2017(11): 64-68

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