Objective To establish reflectance models for AM and FM dots which take the difference of dot structure into account. Methods Based on light scattering probability function which describes the optical properties mathematically and the Murray-Davies model, reflectance models suit for different dots were inferred. Halftone printings' gray values digitized by microscopic acquisition system were transformed into reflectance values. Through the reflectance histogram, the reflectance of not printed paper and printed ink was obtained. By means of fitting measurement reflectance and model predicted reflectance, parameters of the model were determined. Results The evaluation based on total reflectance and spectral reflectance indicates that the R²of AM dots model and FM dots model is 0. 9821 and 0. 9520. Conclusion The models for AM and FM dots are accurate and applicable.