Research of Defect Identification Technology Based on Euclidean Distance Method
LYU Jing, TANG Wan-you, JIANG Rui-xue, HAO Jian-qiang, YI Duan-yang, WANG Hui-fang
Packaging Engineering ›› 2013 ›› Issue (7) : 90-93109.
Research of Defect Identification Technology Based on Euclidean Distance Method
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