Research of Defect Identification Technology Based on Euclidean Distance Method

LYU Jing, TANG Wan-you, JIANG Rui-xue, HAO Jian-qiang, YI Duan-yang, WANG Hui-fang

Packaging Engineering ›› 2013 ›› Issue (7) : 90-93109.

Packaging Engineering ›› 2013 ›› Issue (7) : 90-93109.

Research of Defect Identification Technology Based on Euclidean Distance Method

  • LYU Jing, TANG Wan-you, JIANG Rui-xue, HAO Jian-qiang, YI Duan-yang, WANG Hui-fang
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Abstract

Characters of common printing defects were analyzed. The method to determine the type of defect based on defected geometric shape and printing ink quantity changes was put forward, which used Euclidean distance method to detect shape, position and other parameters of defect. A kind of color density conversion algorithm was designed to judge ink quantity change of printing defect. Printing defect extraction, classification, and feedback was realized.

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LYU Jing, TANG Wan-you, JIANG Rui-xue, HAO Jian-qiang, YI Duan-yang, WANG Hui-fang. Research of Defect Identification Technology Based on Euclidean Distance Method[J]. Packaging Engineering. 2013(7): 90-93109

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