Application Research of Multiple Linear Regression Method in Ink Thickness Detection

WANG Hui-fang; TANG Wan-you; LV Jing; YI Duan-yang

WANG Hui-fang, TANG Wan-you, LV Jing, YI Duan-yang

Packaging Engineering ›› 2012 ›› Issue (5) : 90-92.

Application Research of Multiple Linear Regression Method in Ink Thickness Detection

WANG Hui-fang, TANG Wan-you, LV Jing, YI Duan-yang

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Abstract

The thickness of CMYK patches printed by IGT C1 was calculated and the Lab values of the patches were collected. The relationship between ink thickness and Lab values was established by using multiple linear regression method in Matlab. Experimental results showed that the linear relationship between CMY ink thickness and Lab values is significant.

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WANG Hui-fang, TANG Wan-you, LV Jing, YI Duan-yang. Application Research of Multiple Linear Regression Method in Ink Thickness Detection[J]. Packaging Engineering. 2012(5): 90-92