Lightweight Image Super-resolution Model Fusing Detail Enhancement with Dynamic Up-sampling

YU Mingwei

Packaging Engineering ›› 2026, Vol. 47 ›› Issue (9) : 286-295.

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PDF(22290 KB)
Packaging Engineering ›› 2026, Vol. 47 ›› Issue (9) : 286-295. DOI: 10.19554/j.cnki.1001-3563.2026.09.030
Automatic and Intelligent Technology

Lightweight Image Super-resolution Model Fusing Detail Enhancement with Dynamic Up-sampling

  • YU Mingwei*
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Abstract

To address high complexity and computational cost in image super-resolution models, the work aims to improve reconstruction accuracy and efficiency. The Enhanced Dual Aggregation Transformer (EDAT) was proposed based on the Dual Aggregation Transformer (DAT), fusing image detail enhancement with dynamic up-sampling. By introducing an edge attention and image sharpening enhancement module, the representation capability of local edges and global details was improved. Dynamic up-sampling was adopted to replace traditional up-sampling methods, which significantly reduced model complexity and parameter count while maintaining reconstruction performance. On 4-fold super-resolution tasks, EDAT outperformed DAT, CAT, Swin2SR, SwinIR, and SRCNN on Set5 and Set14. Ablation studies showed EDAT reduced model complexity by approximately 65%, while still improving reconstruction RMSE by about 1.5% compared to DAT. Without extra input information, EDAT effectively balances reconstruction accuracy and efficiency, demonstrating strong potential in resource-constrained and real-time applications.

Key words

image super-resolution / edge attention / image sharpening / dynamic up-sampling / lightweight model

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YU Mingwei. Lightweight Image Super-resolution Model Fusing Detail Enhancement with Dynamic Up-sampling[J]. Packaging Engineering. 2026, 47(9): 286-295 https://doi.org/10.19554/j.cnki.1001-3563.2026.09.030

References

[1] 宗国浩, 张明琰, 王锐, 等. 卷烟包装外观缺陷数据集构建及深度学习检测技术研究[J]. 包装工程, 2024, 45(5): 135-143.
ZONG G H, ZHANG M Y, WANG R, et al.Cigarette Packaging Appearance Defect Data Set Construction and Deep Learning Detection Technology Research[J]. Packaging Engineering, 2024, 45(5): 135-143.
[2] VU T T H, PHAM D L, CHANG T W. A YOLO-Based Real-Time Packaging Defect Detection System[J]. Procedia Computer Science, 2023, 217: 886-894.
[3] LEPCHA D C, GOYAL B, DOGRA A, et al.Image Super-Resolution: A Comprehensive Review, Recent Trends, Challenges and Applications[J]. Information Fusion, 2023, 91: 230-260.
[4] CHEN H G, HE X H, QING L B, et al.Real-World Single Image Super-Resolution: A Brief Review[J]. Information Fusion, 2022, 79: 124-145.
[5] LI H Y, YANG Y F, CHANG M, et al.SRDiff: Single Image Super-Resolution with Diffusion Probabilistic Models[J]. Neurocomputing, 2022, 479: 47-59.
[6] LIM B, SON S, KIM H, et al.Enhanced Deep Residual Networks for Single Image Super-Resolution[C]// 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW). Honolulu, HI, USA. IEEE, 2017: 1132-1140.
[7] ZHANG Y L, TIAN Y P, KONG Y, et al.Residual Dense Network for Image Super-Resolution[C]// 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition. Salt Lake City, UT, USA. IEEE, 2018: 2472-2481.
[8] WANG Y, LI Y S, WANG G, et al.Multi-Scale Attention Network for Single Image Super-Resolution[C]// 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW). Seattle, WA, USA. IEEE, 2024: 5950-5960.
[9] DOSOVITSKIY A, BEYER L, KOLESNIKOV A, et al. An Image Is Worth 16x16 Words: Transformers for Image Recognition at Scale[EB/OL]. 2020: arXiv: 2010.11929. https://arxiv.org/abs/2010.11929
[10] LIU Z, LIN Y T, CAO Y, et al.Swin Transformer: Hierarchical Vision Transformer Using Shifted Windows[C]// 2021 IEEE/CVF International Conference on Computer Vision (ICCV). Montreal, QC, Canada. IEEE, 2022: 9992-10002.
[11] LIANG J Y, CAO J Z, SUN G L, et al.SwinIR: Image Restoration Using Swin Transformer[C]// 2021 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW). Montreal, BC, Canada. IEEE, 2021: 1833-1844.
[12] ZAMIR S W, ARORA A, KHAN S, et al.Restormer: Efficient Transformer for High-Resolution Image Restoration[C]// 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). New Orleans, LA, USA. IEEE, 2022: 5718-5729.
[13] CHEN Z, ZHANG Y L, GU J J, et al.Dual Aggregation Transformer for Image Super-Resolution[C]// 2023 IEEE/CVF International Conference on Computer Vision (ICCV). Paris, France. IEEE, 2024: 12278-12287.
[14] DONG C, LOY C C, HE K M, et al.Image Super-Resolution Using Deep Convolutional Networks[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2016, 38(2): 295-307.
[15] KIM J, LEE J K, LEE K M.Accurate Image Super-Resolution Using very Deep Convolutional Networks[C]// 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). Las Vegas, NV, USA. IEEE, 2016: 1646-1654.
[16] SHI W Z, CABALLERO J, HUSZÁR F, et al. Real-Time Single Image and Video Super-Resolution Using an Efficient Sub-Pixel Convolutional Neural Network[C]// 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). Las Vegas, NV, USA. IEEE, 2016: 1874-1883.
[17] DONG C, LOY C C, TANG X O.Accelerating the Super-Resolution Convolutional Neural Network[C]// Computer Vision-ECCV 2016. Cham: Springer, 2016: 391-407.
[18] CONDE M V, CHOI U J, BURCHI M, et al.Swin2SR: SwinV2 Transformer for Compressed Image Super-Resolution and Restoration[C]// Computer Vision-ECCV 2022 Workshops. Cham: Springer, 2023: 669-687.
[19] LIU W Z, LU H, FU H T, et al.Learning to Upsample by Learning to Sample[C]// 2023 IEEE/CVF International Conference on Computer Vision (ICCV). Paris, France. IEEE, 2024: 6004-6014.
[20] WANG J Q, CHEN K, XU R, et al.CARAFE: Content-Aware ReAssembly of FEatures[C]// 2019 IEEE/CVF International Conference on Computer Vision (ICCV). Seoul, Korea. IEEE, 2019: 3007-3016.
[21] LU H, LIU W Z, FU H T, et al.FADE: Fusing theAssets ofDecoder andEncoder ForTask-Agnostic Upsampling[C]// Computer Vision-ECCV 2022. Cham: Springer, 2022: 231-247.
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