PDF(619 KB)
Overprint Deviation Detection Method Based on K-means Clustering Cross Line
LYU Ming-zhu, WU Xue-yi, CHENG Gang-hu, YUE Xi-na
Packaging Engineering ›› 2020 ›› Issue (1) : 143-148.
PDF(619 KB)
PDF(619 KB)
Overprint Deviation Detection Method Based on K-means Clustering Cross Line
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