一种基于双边假设检验的Contourlet域乘性水印盲检测算法
作者信息
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(1)南京理工大学 泰州科技学院, 泰州 225300; (2)黄山学院, 黄山 245041
折叠
A Two-sided Hypothesis Testing Based Blind Detection Algorithm of Multiplicative Watermarks in Contourlet Transform Domain
- YE Jian-bing1, TAN Shen-yang1, ZHANG Xue-hua2
Author information
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(1)Taizhou Institute of Science and Technology, NJUST, Taizhou 225300, China; (2)Huangshan University, Huangshan 245041, China
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文章历史
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| 出版日期 |
| 2016-11-21 |
| 发布日期 |
| 2016-11-21 |